In digital image correlation, the quality of the data is often dependent on the quality of the speckle pattern. Using an optimal speckle pattern is one of the most important factors in reducing measurement noise and improving overall results. Understanding the requirements of an ideal speckle pattern and how to apply one to a specimen facilitates proper use of DIC. The document attached here discusses:
- Why a good pattern is needed
- Speckle pattern requirements
- Common speckle pattern application methods
- Speckling guidance on some difficult or specific cases
Nick Lovaas
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